Total pressure alone is not enough.
A pressure value shows that something is changing. TOF300 shows what is actually happening in the vacuum:
gas composition, leak signatures, contamination, and process drift, directly at the machine.
Developed in Jena for coating, semiconductor, OEM, and R&D applications.
TOF300 reveals what remains hidden in total pressure.
See live whether water, air, or hydrocarbons are slowing down pump-down. Replace assumptions with direct indications of the actual cause.
Detect helium directly in the relevant mass channel and monitor leak signatures continuously in the process, without a separate leak detector.
Identify hydrocarbon signatures early, before they lead to scrap, additional cleaning, or process instability.
Track changes in gas composition in real time and detect drift, wrong dosing, or unwanted side gases before the process leaves its window.
TOF300 closes the gap between simple total pressure measurement and complex classical gas analysis.
We are looking for field test partners in coating, semiconductor, special-purpose machinery, and research. If gas composition, leak signatures, or contamination matter in your application, talk to us.